|
|
MetrologyTopical Meeting - Structured and Freeform Surfaces 05/12/2012
06/12/2012
euspen is delighted to partner with the National Physical Laboratory UK to bring you this meeting. NPL is the UK's National Measurement Institute and a world-leading centre of excellence in developing and applying the most accurate measurement standards, science and technology available. New work on areal surface topography at NPL
MEMS makers: machinists who work in siliconInteresting article here published in the latest edition of Micromanufacturing magazine. New optical metrology techniqueAlicona Imaging GmbH have pioneered a new optical measurement technique that allows in-depth metrology of 3-D surfaces in the micro and nano range, and meets the ISO 25178 standard for topographical measurement. Full story on micromanufacturing.com. European Metrology Research Programme (EMRP)A call for potential metrology research topics on EMRP is open now to any entity or individual. The deadline for submissions is 28th March 2010. 'Microparts’ Interest Group Workshop 28/10/2009
28/10/2009
Recent advances in modern manufacturing techniques has made it possible to manufacture small and complex components to extremely high accuracies. In direct response to the extreme demands of quality assurance for the measurement of size, form and position of microsystem parts, extensive research is being carried out in the area of geometrical measurement on the micro-scale. |
|
User login |