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Metrology Interest GroupNews of interest to this group will appear here. 13th International Conference on Metrology and Properties of Engineering Surfaces 12/04/2011
14/04/2011
This conference focuses on the progress made in surface metrology, surface characterisation instrumentation and properties of engineering surfaces. New optical metrology techniqueAlicona Imaging GmbH have pioneered a new optical measurement technique that allows in-depth metrology of 3-D surfaces in the micro and nano range, and meets the ISO 25178 standard for topographical measurement. Full story on micromanufacturing.com. European Metrology Research Programme (EMRP)A call for potential metrology research topics on EMRP is open now to any entity or individual. The deadline for submissions is 28th March 2010. EUSPEN 2010 31/05/2010
04/06/2010
Fundamental Principles of Engineering Nanometrology
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User loginMetrology Interest Group
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